当前位置: 首页 >> 师资队伍 >> 讲师&博士后 >> 正文

王成财

发布时间:2025-09-25点击数:

王成财 讲师

联系方式:wangchengcai@gdut.edu.cn

通讯地址:广东工业大学大学城校区理学馆

所属团队:宽禁带半导体器件与集成团队

简介:

王成财,博士、讲师、青百B层次人才,博士毕业于南方科技大学,主要致力于第三代宽禁带半导体氮化镓材料(GaN)的电力电子器件的研究,在氮化镓电力电子器件的器件设计,微纳加工工艺、表征测试、器件物理及可靠性分析等方面进行相关研究。

研究方向:

1. 宽禁带功率半导体器件

2. 半导体器件物理

3. 可靠性表征,失效分析

教育经历:

南方科技大学 物理学 博士

中山大学 光学工程 硕士

工作经历:

广东工业大学 集成电路学院 讲师

香港理工大学 研究助理

华为科技有限公司 工程师

主要荣誉:

南方科技大学优秀毕业生

EDTM最佳论文奖

科研成果:

1. C. Wang, et al, "E-Mode p-n Junction/AlGaN/GaN (PNJ) HEMTs," IEEE Electron Device Letters, 2020. ESI高被引)

2. C. Wang, et al, " Normally-off HEMT-based Bipolar p-FET with Enhanced Conduction Capability," IEEE Transactions on Electron Device, 2025.

3. C. Wang, et al, " Gate reliability enhancement of p-GaN gate HEMTs with oxygen compensation technique," Applied Physics Express, 2024. Power electronics world报道)

4. C. Wang et al., " GIT-Based Bipolar p-FET with Enhanced Conduction Capability on E-mode GaN-on-Si HEMT Platform," 2025 35th Electron Devices Technology and Manufacturing Conference (EDTM’2025), Hong Kong, 2025. 2025年最佳论文奖)

5. C. Wang et al, "E-mode p-n Junction/AlGaN/GaN HEMTs with Enhanced Gate Reliability," 2020 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD’20), Vienna, Austria, 2020.

6. C. Wang et al, “Impacts of n-GaN Doping Concentration on Gate Reliability of p-n Junction/AlGaN/GaN HEMTs," 2023 Int. Symp. On Power Semiconductor Devices and ICs (ISPSD’23), Hongkong, 2023.

7. X. Liang, C. Wang, et al, "Efficient Defect Engineering for Solution Combustion Processed In-Zn-O thin films for high performance transistors," Semiconductor Science & Technology, 2017. (共同一作)

8. M. Hua, C. Wang, et al, "Gate Current Transport in Enhancement-mode p-n Junction/AlGaN/GaN (PNJ) HEMT," in IEEE Electron Device Letters, 2021.

9. M. Hua, J. Chen, C. Wang, et al, "E-mode p-FET-bridge HEMT for Higher VTH and Enhanced Stability,", in 2020 IEEE International Electron Devices Meeting (IEDM), 2020.

10. J. Tang, Z. Jiang, C. Wang, et al, " Bipolar p-FET with Enhanced Conduction Capability on E-mode GaN-on-Si HEMT Platform", in 2023 IEEE International Electron Devices Meeting (IEDM), 2023.

11. X. Zhao, P. Song, C. Wang, et al, "Engineering covalently bonded 2D layered materials by self-intercalation," Nature, 2020.


上一篇:周贤中

下一篇:吴婷婷